Elli-SEUN (Ellipsometer)
페이지 정보
본문
Spectroscopic Ellipsometer(SE), the industry standard technology that enables one to accurately measure thickness and optical constants of thin film, simultaneously, is used for characterization of a variety of materials (e.g., dielectrics, semiconductors, organics, etc.) including AR coatings, OLED, and low(high)-materials.
◈FEATURE
1.Easy Operation & Fast Measurement
2.High Reproducibility
3.User-Friendly Operation
4.Non-contact & Non-destructive
5.Multi-Layer Measurement
6. Wide Spectral Range
◈SPECIFICATION
Measuring constants |
Film thickness, n, k vs λ |
Thickness range |
sub Å ~ 10 μm (depends on film type) |
Wavelength range |
240 ~ 1700 nm Option of Spectral Range - (Duv:193nm, IR:900nm~ 2,200nm) |
Throughput |
Normal mode(~10 sec) fast mode (1~3 sec) per point(depends on film type) |
Beam Spot-size |
1.5 mm (Optional 100μm, 50 μm, 20 μm) |
Angle of incidence |
45°~90° (Step 5°, manual type) |
Number of layers |
Up to ten(10) layers (depends on film type) |
Repeatability |
(3σ) ±0.3 Å on 10 times measurement |
Application |
Semiconductors, Display, Optical Coatings, Chemistry/Biology, Conductive Organics, Photovoltaics etc.
|
Providing features |
Refractive Index, Extinction coefficient and optical band gap Film density and composition, Material's dispersion function library User defined models capability, Data import & export functions, - Extendable library |
◈OPTION
1.Auto Mapping Stage (150 mm, 200 mm, 300 mm, Customized Size)
2.Option of Spectral Range (UV: 193 nm ~ 1,050 nm), (IR:, 900nm~
2,200nm)
3.Micro Spot Option (100 μm, 50 μm, 25 μm)
4.Auto Alignment System, Automated Variable Angle of Incidence (45°~ 90°)